X-ray computed tomography has evolved enormously in the last two decades. State-of-the-art clinical CT scanners now offer sub-mm spatial resolution, up to 160mm longitudinal coverage, as low as 0.27s rotation speed and can detect density changes on the order of less than a percent. This talk will focus on a selection of recent advances developed at GE Global Research, including dual energy CT by fast voltage switching, model-based iterative reconstruction, cardiac motion correction and inverse-geometry CT and give a perspective on the general trends in CT research.
Dr. Bruno De Man earned his B.S., M.S. and Ph.D. degrees in Electrical Engineering from the University of Leuven, where he performed research in the areas of ultrasonic tissue characterization (echocardiography) and CT iterative reconstruction for metal artifact reduction. He joined GE Global Research in June 2001 where his research included CT simulations, cone-beam reconstruction, iterative reconstruction, and multi-source inverse-geometry CT. He is currently manager of the CT Systems and Applications Laboratory and CT research portfolio leader for GE Global Research. Dr. De Man has close collaborations with Stanford University, University of Michigan, Rensselaer Polytechnic Institute, University of Washington and Massachusetts General Hospital. He has filed over 80 US patent applications and has over 100 international publications.
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